High Voltage Measurement Equipment

95X Series Hipot Testers

More Speed, More Power, Better Resolution, More Functionality

For Demanding Hipot Tests

The 6.5KVDC models offer 50mA of source current for DC Hipot – providing the power you need to rapidly charge and discharge challenging DUTs. Models are also available with DC Hipot up to 11KV and 15KV. Most of the 95x series also offer 50mA of sourcing for AC Hipot, but for heavier AC loads the 95X can be configured to source up to 100mA or even as much as 200mA. For higher AC Hipot voltages the 95X can generate up to 10KV internally and all models are available with an external 30KVAC Hipot option

When it comes to making critical leakage current measurements, the 95X delivers rock-solid resolution down to 100 pico-amps. This high resolution provides built-in insulation resistance measurement (IR) up to a Tera-ohm, add a 4-wire milli-ohmmeter with auto ranging up to 100K ohm and an available 40 Amp Ground Bond function – and you are beginning to understand the versatility of the Vitrek 95X Series.

Need To Hipot Multiple Test Points?

The 95X can directly control up to four 64 channel HV scanners, right out of the box. That is up to 256 test points and using a PC with Vitrek’s QuickTest Pro software you can expand the count up to 640 test points. The HV Switching System of choice is the Vitrek 964i which can hold eight 8 channel switching cards – available in 7, 10 & 15 KV ratings. The 964i also has switching cards to handle routing up to 40 Amp ground bond currents.

V7X Series Hipot Testers

The Hipot Experience has been Redefined

The V7X provides state-of-the-art performance in a powerful yet compact multi-function Hipot tester – and do it at an entry level price. From our easy-to-use Touch user interface to its ultra-reliability, high efficiency, fan free design – the V7X provides unrivalled performance.

V75 with Built-in Hipot Switching

For high voltage cable & component testing – choose the V75 with 16 channels of built-in high voltage switching. With the versatile V75, you can test Hipot or IR for any combination of up to 8 test points and you can measure low resistance (from .001 ohm to 60K ohms) on up to 8 conductors. All automatically with a single touch and all from a single compact tester. For requirements exceeding 8 points, the V7X can control up to 4 Vitrek 964i 64 channel HV Switching Systems – providing up to 256 channels of Hipot test capability. Simple, fast, automatic multi-point Hipot – make the switch to the Vitrek V7X.

Proforma 300iSA – High-Precision Wafer Geometry Measurement for Si, SiC & GaN

The Proforma 300iSA from MTI Instruments (Vitrek Group) is a proven, high-accuracy non-contact wafer geometry system designed for fabs and OSATs that need reliable measurement of TTV, Bow, Warp and Thickness.

Whether you are processing silicon, SiC, GaN, GaAs or InP, the Proforma delivers fast, repeatable and production-ready results — without the cost and complexity of high-end optical metrology.

Exyne Asia is the official partner for Thailand and Southeast Asia, offering free wafer sample measurement, training and support.

Advanced Wafer Metrology for Modern Semiconductor Production

As wafer materials become harder, thinner and more fragile — especially SiC and GaN — traditional optical systems often reach their limits.

The Proforma 300iSA solves this with high-precision capacitive sensors that are immune to surface reflectivity, transparency and polishing artifacts.

Perfect for fabs that need stable results without maintenance-heavy optics.

What the Proforma 300iSA Measures

The system performs complete SEMI-standard geometry analysis, including:

• TTV – Total Thickness Variation: Ensures uniform wafer thickness across the entire diameter.
• Bow: Detects wafer curvature caused by grinding, EPI stress or thermal processes.
• Warp: Identifies overall wafer deformation — critical for lithography and bonding steps.
• Thickness (Absolute & Differential): Fast, accurate thickness measurement in a single automated cycle.
• Site-Level Thickness (SEMI M1/M6): Ideal for incoming QC and process qualification.

All measurements are non-contact, highly repeatable, and resistant to material variations.

Ideal for EPI, CMP, Thinning & Incoming Inspection

The Proforma 300iSA is widely used in:

• Epitaxy (EPI): Monitor stress-induced Bow/Warp after EPI growth.
• CMP & Polishing: Optimize material removal and post-polish flatness.
• Wafer Thinning / Grinding: Ensure thickness uniformity during backside processes.
• Incoming Inspection (Fabs & OSATs): Catch out-of-tolerance wafers before they enter production.
• SiC / GaN Power Device Manufacturing: Stable measurements even on dark, transparent or rough surfaces.

Request a Demo or Sample Measurement

Want to see real results from your wafers?
We offer free sample measurements for Si, SiC and GaN wafers.

4700 Precision High Voltage Meter

The Vitrek 4700 Precision High Voltage Meter is the top choice when you require high voltage test equipment, the 4700 offers the highest level of measurement accuracy, yet is surprisingly easy to use. Vitrek has harnessed DSP technology to provide outstanding AC & DC voltage accuracy, stability and resolution. Performance that rivals traditional HV reference dividers, yet unlike the delicate HV divider, the 4700 provides instant, direct, high voltage measurements in a highly portable, compact and rugged bench top enclosure.

4700-chart-mode-screen

The 4700’s large, high resolution, colour, touch graphic display simultaneously shows the AC and DC content of the voltage being measured and can plot readings from a few seconds to several days.

Direct Measurement or HV SmartProbe™

Vitrek’s 4700 precisely measures voltages directly up to 10KV – with no external probes. That’s high enough for most of the HV sources out there. However, should you care to expand your high voltage measurement range – just add one or more of the available 35KV, 70KV, 100KV and 150KV SmartProbes™. The Vitrek SmartProbes™ each store their own calibration data which is downloaded when they are plugged in to the 4700 – this results in high accuracy, calibrated readings and allows any Vitrek SmartProbe™ to be used with any 4700 High Voltage Meter. The SmartProbe’s™ proprietary, ultra-low TC attenuator design minimizes self-heating – while its lower capacitance construction technology enhances AC performance. In addition to the direct input terminal the 4700 has two probe inputs – use one probe to extend your measurement range or use two probes for making high voltage differential measurements.

Superior High Voltage Measurement Equipment

To ensure the best possible measurement accuracy, the 4700 makes over 40,000 reading per second which are then filtered, sub-sampled, scaled and offset corrected – all with “error free” mathematic methodology. The True RMS AC readings are as true as they come, while the DC measurements offer rocket fast settling with rock solid stability. In addition to this, the 4700 provides VLF AC readings down to 0.01 Hz, as well as peak to peak, crest factor and fundamental frequency measurement. Available G series probes offer extremely high input impedance options for electrostatic voltmeter applications.

High Voltage Test Automation

With Vitrek’s high voltage test automation feature, you can automate your HV test requirement with the 4700’s built-in Ethernet port, high speed serial communication port or available GPIB. The 4700 is fully programmable – so you can select your measurement mode and bandwidth, then take readings as often as desired. The 4700 high voltage tester also comes standard with a USB printer port, to capture readings and get hardcopy printouts of HV plots – so you can document the sag or overshoot in a typical Hipot test.

Available ISO 17025 Accredited Calibration

The 4700 and probes come with an ISO 17025 accredited calibration certificate with data at no charge. Vitrek is accredited to ISO 17025 by A2LA.

Accumeasure Gen 3 – Non-Contact Nanometer Measurement for Advanced Manufacturing

The Accumeasure Gen 3 is a true next-generation digital capacitance measurement system delivering sub-nanometer resolution, 0.01% linearity, and high-speed, non-contact measurement for the world’s most demanding industries. From wafer geometry and semiconductor packaging to automotive brake rotor runout and precision optics — Accumeasure Gen 3 sets a new benchmark for accuracy, speed, and reliability.

What Makes Accumeasure Gen 3 Unique?

Accumeasure Gen 3 combines touchless measurement, 24-bit digital conversion, and ultra-low noise electronics to correctly measure distances, gaps, thickness, and surface variations — even on floating, ungrounded, or high-value materials.

Key advantages at a glance

• Non-contact measurement – no tool marks, no surface damage
• Sub-nanometer resolution – detects changes smaller than 0.0000001 mm
• 0.01% linearity – exceptional accuracy across the full measuring range
• Up to 20 kHz sampling rate – ideal for fast surfaces and dynamic processes
• Works on grounded and ungrounded targets (Push/Pull technology)
• Digital USB/Ethernet output – plug directly into PC, PLC, or automation
• Full software suite included – LabVIEW drivers, DLL libraries, logging tools

Perfect for High-Value Applications

Accumeasure Gen 3 fits seamlessly into advanced manufacturing where conventional sensors reach their limits.

Request a Sample Measurement

We offer free sample measurements for:
Si wafers, SiC wafers, GaN wafers, Glass, optics, and precision components.

See real results before investing.